Degradation of Low-Frequency Noise in PD SOI MOSFETs after Hot-Carrier Stress

Kun-Ming Chen; Hsin-Hui Hu; Guo-Wei Huang; Chun-Yen Chang

doi:https://doi.org/10.7567/SSDM.2004.P4-9L

2004 International Conference on Solid State Devices and Materials

Sep 14, 2004 - Sep 17, 2004
Tower Hall Funabori, Tokyo, Japan

[P4-9L] Degradation of Low-Frequency Noise in PD SOI MOSFETs after Hot-Carrier Stress

Kun-Ming Chen, Hsin-Hui Hu, Guo-Wei Huang, Chun-Yen Chang (1.National Nano Device Laboratories, 2.Department of Electronics Engineering, National Chiao Tung University)

https://doi.org/10.7567/SSDM.2004.P4-9L

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