[P4-9L] Degradation of Low-Frequency Noise in PD SOI MOSFETs after Hot-Carrier Stress

Kun-Ming Chen、Hsin-Hui Hu、Guo-Wei Huang、Chun-Yen Chang (1.National Nano Device Laboratories、2.Department of Electronics Engineering, National Chiao Tung University)

https://doi.org/10.7567/SSDM.2004.P4-9L