The Japan Society of Applied Physics

[P4-9L] Degradation of Low-Frequency Noise in PD SOI MOSFETs after Hot-Carrier Stress

Kun-Ming Chen, Hsin-Hui Hu, Guo-Wei Huang, Chun-Yen Chang (1.National Nano Device Laboratories, 2.Department of Electronics Engineering, National Chiao Tung University)

https://doi.org/10.7567/SSDM.2004.P4-9L