[F-1-5] Studies on the Nature of Deep Level Defects in GaCrN Diluted Magnetic Semiconductor

S. Shanthi、S. Kimura、S. Kobayashi、M. S. Kim、Y. K. Zhou、H. Hasegawa、H. Asahi (1.The Institute of Scientific and Industrial Research, Osaka University)

https://doi.org/10.7567/SSDM.2005.F-1-5