Surface Hall Potentiometry to Characterize Functional Semiconductor Films

Kenta Arima; Kenji Hiwa; Ryoji Nakaoka; Mizuho Morita

doi:https://doi.org/10.7567/SSDM.2005.F-4-6

2005 International Conference on Solid State Devices and Materials

2005年9月12日〜 2005年9月15日
International Conference Center Kobe, Kobe, Japan

[F-4-6] Surface Hall Potentiometry to Characterize Functional Semiconductor Films

Kenta Arima、Kenji Hiwa、Ryoji Nakaoka、Mizuho Morita (1.Department of Precision Science and Technology, Graduate School of Engineering, Osaka University)

https://doi.org/10.7567/SSDM.2005.F-4-6

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