Technology Trend of Soft Errors based on Accurate Estimation Method

Y. Tosaka; R. Takasu; H. Ehara; T. Uemura; H. Oka; S. Satoh; N. Matsuoka; K. Hatanaka

doi:https://doi.org/10.7567/SSDM.2005.H-3-3

2005 International Conference on Solid State Devices and Materials

Sep 12, 2005 - Sep 15, 2005
International Conference Center Kobe, Kobe, Japan

[H-3-3] Technology Trend of Soft Errors based on Accurate Estimation Method

Y. Tosaka, R. Takasu, H. Ehara, T. Uemura, H. Oka, S. Satoh, N. Matsuoka, K. Hatanaka (1.Fujitsu Laboratories Ltd., 2.Fujitsu Ltd., 3.Reserch Center for Nuclear Physics, 4.Osaka University)

https://doi.org/10.7567/SSDM.2005.H-3-3

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