Technology Trend of Soft Errors based on Accurate Estimation Method

Y. Tosaka; R. Takasu; H. Ehara; T. Uemura; H. Oka; S. Satoh; N. Matsuoka; K. Hatanaka

doi:https://doi.org/10.7567/SSDM.2005.H-3-3

2005 International Conference on Solid State Devices and Materials

2005年9月12日〜 2005年9月15日
International Conference Center Kobe, Kobe, Japan

[H-3-3] Technology Trend of Soft Errors based on Accurate Estimation Method

Y. Tosaka、R. Takasu、H. Ehara、T. Uemura、H. Oka、S. Satoh、N. Matsuoka、K. Hatanaka (1.Fujitsu Laboratories Ltd.、2.Fujitsu Ltd.、3.Reserch Center for Nuclear Physics、4.Osaka University)

https://doi.org/10.7567/SSDM.2005.H-3-3

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