[I-7-2] Characterization and Modeling of Microwave Noise in InP/InGaAs Composite Channel High Electron Mobility Transistors (HEMTs)

Yuwei Liu、Hong Wang、Rong Zeng (1.Microelectronics Centre School of Electrical and Electronic Engineering Nanyang Technological University)

https://doi.org/10.7567/SSDM.2005.I-7-2