[P3-4] The Impact of Body-Potential on Hot-Carrier-Induced Device Degradation for 90nm Partially-Depleted SOI nMOSFETs

Chieh-Ming Lai、Chien-Ting Lin、Yean-Kuen Fang、Wen-Kuan Yeh、Jia-Wei Syu、W. T. Shiau (1.Institute of Microelectronics, National Cheng Kung University、2.Department of Electrical Engineering, National University of Kaohsiung、3.United Microelectronics Corporation, Central R&D Division)

https://doi.org/10.7567/SSDM.2005.P3-4