THD Measurement and Compensation for Analog Circuits with Fine CMOS Devices

Takanori Komuro; Shingo Sobukawa; Haruo Kobayashi; Hiroshi Sakayori

doi:https://doi.org/10.7567/SSDM.2005.P5-7

2005 International Conference on Solid State Devices and Materials

Sep 12, 2005 - Sep 15, 2005
International Conference Center Kobe, Kobe, Japan

[P5-7] THD Measurement and Compensation for Analog Circuits with Fine CMOS Devices

Takanori Komuro, Shingo Sobukawa, Haruo Kobayashi, Hiroshi Sakayori (1.Agilent Technologies International Japan, Ltd., 2.NF Corporation, 3.Gunma University)

https://doi.org/10.7567/SSDM.2005.P5-7

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