Extremely Low Noise Characteristics of 0.15 μm Power Metamorphic HEMT

Jae Yeob Shim; Hyung Sup Yoon; Dong Min Kang; Ju Yeon Hong; Kyung Ho Lee

doi:https://doi.org/10.7567/SSDM.2005.P6-1

2005 International Conference on Solid State Devices and Materials

Sep 12, 2005 - Sep 15, 2005
International Conference Center Kobe, Kobe, Japan

[P6-1] Extremely Low Noise Characteristics of 0.15 μm Power Metamorphic HEMT

Jae Yeob Shim, Hyung Sup Yoon, Dong Min Kang, Ju Yeon Hong, Kyung Ho Lee (1.InP IC Team, Basic Research Laboratory, Electronics and Telecommunications Research Institute)

https://doi.org/10.7567/SSDM.2005.P6-1

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