[A-1-4] Imaging of interference between incident and reflected electron waves at an InAs/GaSb heterointerface by low-temperature scanning tunneling spectroscopy

K. Suzuki, K. Kanisawa, S. Perraud, M. Ueki, K. Takashina, Y. Hirayama (1.NTT Basic Research Laboratories, NTT Corporation, 2.Laboratoire de Photonique et de Nanostructures, CNRS, 3.NTT Electronics Techno Corporation, 4.SORST-JST, 5.Graduate School of Science, 6.Tohoku University)

https://doi.org/10.7567/SSDM.2006.A-1-4