[A-8-4] Observation of single-electron pump operation with one ac gate bias in phosphorous-doped Si wires

D. Moraru, Y. Ono, H. Inokawa, K. Yokoi, R. Nuryadi, H. Ikeda, M. Tabe (1.Research Institute of Electronics, Shizuoka University, 2.NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation.)

https://doi.org/10.7567/SSDM.2006.A-8-4