[A-8-4] Observation of single-electron pump operation with one ac gate bias in phosphorous-doped Si wires

D. Moraru、Y. Ono、H. Inokawa、K. Yokoi、R. Nuryadi、H. Ikeda、M. Tabe (1.Research Institute of Electronics, Shizuoka University、2.NTT Basic Research Laboratories, Nippon Telegraph and Telephone Corporation.)

https://doi.org/10.7567/SSDM.2006.A-8-4