The Japan Society of Applied Physics

[B-3-1] High Brightness and Crack-free InGaN/GaN Light Emitting Diode With AlGaN Buffer Layer On Si (111)

Y. P. Hsu, S. J. Chang, Y. K. Su, W. S. Chen, J. K. Sheu, J. Y. Chu, C. T. Kuo (1.Institute of Microelectronics & Department of Electrical Engineering National Cheng Kung University, 2.Institute of Electro-Optical Science and Engineering National Cheng Kung University, 3.Epitech Technology Corporation)

https://doi.org/10.7567/SSDM.2006.B-3-1