[E-9-6] SiO2 Passivation Effects on the Leakage Current in Dual-Gate AlGaN/GaN High Electron Mobility Transistors

Min-Woo Ha, Jiyong Lim, Young-Hwan Choi, Jin-Cherl Her, Kwang-Seok Seo, Min-Koo Han (1.School of Electrical Engineering, Seoul National University)

https://doi.org/10.7567/SSDM.2006.E-9-6