[E-9-6] SiO2 Passivation Effects on the Leakage Current in Dual-Gate AlGaN/GaN High Electron Mobility Transistors

Min-Woo Ha、Jiyong Lim、Young-Hwan Choi、Jin-Cherl Her、Kwang-Seok Seo、Min-Koo Han (1.School of Electrical Engineering, Seoul National University)

https://doi.org/10.7567/SSDM.2006.E-9-6