[F-8-5] Thickness Dependent Nano-Crystallization in Ge2Sb2Te5 films and Its Effect on Devices

Wei Xiaoqian、Shi Luping、Chong Tow Chong (1.Data Storage Institute、2.Elec. &Comp. Eng. department, National University of Singapore)

https://doi.org/10.7567/SSDM.2006.F-8-5