Dynamics of Defects in Strained Silicon, Strained SiGe and Strained Germanium

Alexander Reznicek; Stephen W. Bedell; Joel P. de Souza; Klaus W. Schwarz; Keith E. Fogel; John A. Ott; Harold J. Hovel; Devendra K. Sadana

doi:https://doi.org/10.7567/SSDM.2006.I-8-2

2006 International Conference on Solid State Devices and Materials

Sep 12, 2006 - Sep 15, 2006
PACIFICO Yokohama, Yokohama, Japan

[I-8-2] Dynamics of Defects in Strained Silicon, Strained SiGe and Strained Germanium

Alexander Reznicek, Stephen W. Bedell, Joel P. de Souza, Klaus W. Schwarz, Keith E. Fogel, John A. Ott, Harold J. Hovel, Devendra K. Sadana (1.IBM Thomas J Watson Research Center)

https://doi.org/10.7567/SSDM.2006.I-8-2

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