Dynamics of Defects in Strained Silicon, Strained SiGe and Strained Germanium

Alexander Reznicek; Stephen W. Bedell; Joel P. de Souza; Klaus W. Schwarz; Keith E. Fogel; John A. Ott; Harold J. Hovel; Devendra K. Sadana

doi:https://doi.org/10.7567/SSDM.2006.I-8-2

2006 International Conference on Solid State Devices and Materials

2006年9月12日〜 2006年9月15日
PACIFICO Yokohama, Yokohama, Japan

[I-8-2] Dynamics of Defects in Strained Silicon, Strained SiGe and Strained Germanium

Alexander Reznicek、Stephen W. Bedell、Joel P. de Souza、Klaus W. Schwarz、Keith E. Fogel、John A. Ott、Harold J. Hovel、Devendra K. Sadana (1.IBM Thomas J Watson Research Center)

https://doi.org/10.7567/SSDM.2006.I-8-2

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