Intrinsic Electronically-Active Defects in Transition Metal Elemental Oxides

Gerald Lucovsky; Hyungtuk Seo; Les B Fleming; Marc D Ulrichand; Jan Luning

doi:https://doi.org/10.7567/SSDM.2006.J-7-5

2006 International Conference on Solid State Devices and Materials

2006年9月12日〜 2006年9月15日
PACIFICO Yokohama, Yokohama, Japan

[J-7-5] Intrinsic Electronically-Active Defects in Transition Metal Elemental Oxides

Gerald Lucovsky、Hyungtuk Seo、Les B Fleming、Marc D Ulrichand、Jan Luning (1.NC State University, Department of Physics、2.Stanford Synchrotron Radiation Laboratory)

https://doi.org/10.7567/SSDM.2006.J-7-5

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