[P-1-12] Ultra-thin Oxide Lifetime Projection and Comparison of nFET and pFET for 90nm/65nm Application

Cheng-Li Lin、Tom Kao、Ju-Ping Chen、Jerry Shieh、K. C. Su (1.Q&RA Division, United Microelectronics Corporation (UMC))

https://doi.org/10.7567/SSDM.2006.P-1-12