[P-3-26] Hot-Carrier Reliability Improvement in Submicron High-Voltage DMOS Transistors

Jone F. Chen, J. R. Lee, Kuo-Ming Wu, Yan-Kuin Su, H. C. Wang, Y. C. Lin, S. L. Hsu (1.Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, 2.Taiwan Semiconductor Manufacturing Company)

https://doi.org/10.7567/SSDM.2006.P-3-26