[P-3-26] Hot-Carrier Reliability Improvement in Submicron High-Voltage DMOS Transistors

Jone F. Chen、J. R. Lee、Kuo-Ming Wu、Yan-Kuin Su、H. C. Wang、Y. C. Lin、S. L. Hsu (1.Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University、2.Taiwan Semiconductor Manufacturing Company)

https://doi.org/10.7567/SSDM.2006.P-3-26