[P-6-4] Auger Effect of Hole Accumulation on Characteristics of InAlAs/InGaAs HEMTs

Hirohisa Taguchi, Hiroaki Murakami, Mashashi Oura, Tsutomu Iida, Yoshifumi Takanashi (1.Department of Materials Science and Technology, Faculty of Industrial Science and Technology Tokyo University of Science)

https://doi.org/10.7567/SSDM.2006.P-6-4