The Japan Society of Applied Physics

[P-7-13] Junction Temperature and Thermal Resistance Measurement in High-Power Light Emitting Diodes Using A Real-Time Diode Forward Voltage Sampling Technique

Shui-Jinn Wang, Tron-Min Chen, Kai-Ming Uang, Shiue-Lung Chen, Der-Ming Kuo, Hon-Yi Kuo, Bor-Wen Liou, Su-Hua Yang (1.Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, 2.Dept. of Electrical Eng., Wu-Feng Institute of Technology, 3.Dept. of Computer Science and Information Eng., Wu-Feng Institute of Technology, 4.National Kaohsiung University of Applied Sciences, Department of Electronic Engineering)

https://doi.org/10.7567/SSDM.2006.P-7-13