[P-7-13] Junction Temperature and Thermal Resistance Measurement in High-Power Light Emitting Diodes Using A Real-Time Diode Forward Voltage Sampling Technique

Shui-Jinn Wang、Tron-Min Chen、Kai-Ming Uang、Shiue-Lung Chen、Der-Ming Kuo、Hon-Yi Kuo、Bor-Wen Liou、Su-Hua Yang (1.Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University、2.Dept. of Electrical Eng., Wu-Feng Institute of Technology、3.Dept. of Computer Science and Information Eng., Wu-Feng Institute of Technology、4.National Kaohsiung University of Applied Sciences, Department of Electronic Engineering)

https://doi.org/10.7567/SSDM.2006.P-7-13