[P-7-18] High electrical stress influence on reliability characteristics of polarization-induced GaN-InGaN MQW LEDs

Ja-Soon Jang、Hyun Hwi Lee (1.Korea University, Research Institute of Engineering and Technology、2.Pohang Accelerator Laboratory (PAL), POSTECH)

https://doi.org/10.7567/SSDM.2006.P-7-18