[P-9-1] Effects of Thermal Effusivity in Nanocrystalline Porous Silicon on Long-Term Operation of Thermally Induced Ultrasonic Emission

Yoshifumi Watabe, Yoshiaki Honda, Nobuyoshi Koshida (1.New Product Technologies Development Department, Matsushita Electric Works, Ltd., 2.Department of Electrical and Electronic Engineering, Faculty of Technology, Graduate School of Eng., Tokyo University of Agriculture and Technology)

https://doi.org/10.7567/SSDM.2006.P-9-1