[A-2-3] Experimental Evidence of Coexistence of Interface Traps Interacting with Majority and Minority Carriers in Ge MIS Structures

N. Taoka、Y. Yamashita、M. Harada、K. Ikeda、T. Yamamoto、N. Sugiyama、S. Takagi (1.MIRAI-ASRC、2.MIRAI-ASET、3.The University of Tokyo)

https://doi.org/10.7567/SSDM.2007.A-2-3