[A-2-3] Experimental Evidence of Coexistence of Interface Traps Interacting with Majority and Minority Carriers in Ge MIS Structures

N. Taoka, Y. Yamashita, M. Harada, K. Ikeda, T. Yamamoto, N. Sugiyama, S. Takagi (1.MIRAI-ASRC, 2.MIRAI-ASET, 3.The University of Tokyo)

https://doi.org/10.7567/SSDM.2007.A-2-3