Improvement in Characteristics of InGaAs/GaAs Quantum-Dot PIN Photodetectors with Antireflection Photonic Crystals

J. J. Chen; Y. K. Su; R. W. Chuang; H. C. Yu; W. C. Chen; K. Y. Cheng; T. H. Shen

doi:https://doi.org/10.7567/SSDM.2007.E-1-6

2007 International Conference on Solid State Devices and Materials

2007年9月18日〜 2007年9月21日
Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan

[E-1-6] Improvement in Characteristics of InGaAs/GaAs Quantum-Dot PIN Photodetectors with Antireflection Photonic Crystals

J. J. Chen、Y. K. Su、R. W. Chuang、H. C. Yu、W. C. Chen、K. Y. Cheng、T. H. Shen (1.Institute of Microelectronics, Department of Electrical Engineering, and Advanced Optoelectronic Technology Center National Cheng Kung University)

https://doi.org/10.7567/SSDM.2007.E-1-6

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