Dynamic response of interface state charges in GaN MIS structures

Kimihito Ooyama; Hiroki Kato; Marcin Miczek; Tamotsu Hashizume

doi:https://doi.org/10.7567/SSDM.2007.G-6-1

2007 International Conference on Solid State Devices and Materials

Sep 18, 2007 - Sep 21, 2007
Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan

[G-6-1] Dynamic response of interface state charges in GaN MIS structures

Kimihito Ooyama, Hiroki Kato, Marcin Miczek, Tamotsu Hashizume (1.Research Center for Integrated Quantum Electronics (RCIQE) and, 2.Graduate School of Information Science and Technology, Hokkaido University, 3.Electronics Division, Sumitomo Metal Mining)

https://doi.org/10.7567/SSDM.2007.G-6-1

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