Evidence of Electron Trapping Center at Pentacene/SiO2 Interface

Chang Bum Park; Takamichi Yokoyama; Tomonori Nishimura; Koji Kita; Akira Toriumi

doi:https://doi.org/10.7567/SSDM.2007.H-8-6

2007 International Conference on Solid State Devices and Materials

Sep 18, 2007 - Sep 21, 2007
Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan

[H-8-6] Evidence of Electron Trapping Center at Pentacene/SiO2 Interface

Chang Bum Park, Takamichi Yokoyama, Tomonori Nishimura, Koji Kita, Akira Toriumi (1.Department of Materials Engineering, School of Engineering, The University of Tokyo)

https://doi.org/10.7567/SSDM.2007.H-8-6

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