Evidence of Electron Trapping Center at Pentacene/SiO2 Interface

Chang Bum Park; Takamichi Yokoyama; Tomonori Nishimura; Koji Kita; Akira Toriumi

doi:https://doi.org/10.7567/SSDM.2007.H-8-6

2007 International Conference on Solid State Devices and Materials

2007年9月18日〜 2007年9月21日
Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan

[H-8-6] Evidence of Electron Trapping Center at Pentacene/SiO2 Interface

Chang Bum Park、Takamichi Yokoyama、Tomonori Nishimura、Koji Kita、Akira Toriumi (1.Department of Materials Engineering, School of Engineering, The University of Tokyo)

https://doi.org/10.7567/SSDM.2007.H-8-6

▲