Electrical Conducting Properties of Amorphous Carbon Nanowhiskers Studied by In Situ High-Resolution Transmission Electron Microscopy

Ryoei Kato; Kun'ichi Miyazawa; Tokushi Kizuka

doi:https://doi.org/10.7567/SSDM.2007.P-10-3

2007 International Conference on Solid State Devices and Materials

Sep 18, 2007 - Sep 21, 2007
Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan

[P-10-3] Electrical Conducting Properties of Amorphous Carbon Nanowhiskers Studied by In Situ High-Resolution Transmission Electron Microscopy

Ryoei Kato, Kun'ichi Miyazawa, Tokushi Kizuka (1.Institute of Materials Science, Graduate School of Pure and Applied Sciences, University of Tsukuba, 2.National Institute for Materials Science)

https://doi.org/10.7567/SSDM.2007.P-10-3

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