Impacts of Body Contact Structures on SOI NMOSFET DC, RF, and 1/f Noise Characteristics

Rong Yang; Yong Zhong Xiong; J. L. Shi; H. Qian; J. F. Li; J. Fu; W. Y. Loh; M. B. Yu; G. Q. Lo; N. Balasubramanian; D. -L. Kwong

doi:https://doi.org/10.7567/SSDM.2007.P-3-23

2007 International Conference on Solid State Devices and Materials

Sep 18, 2007 - Sep 21, 2007
Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan

[P-3-23] Impacts of Body Contact Structures on SOI NMOSFET DC, RF, and 1/f Noise Characteristics

Rong Yang, Yong Zhong Xiong, J. L. Shi, H. Qian, J. F. Li, J. Fu, W. Y. Loh, M. B. Yu, G. Q. Lo, N. Balasubramanian, D. -L. Kwong (1.Institute of Microelectronics, 2.Institute of Microelectronics, Chinese Academy of Sciences)

https://doi.org/10.7567/SSDM.2007.P-3-23

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