The Japan Society of Applied Physics

[P-3-23] Impacts of Body Contact Structures on SOI NMOSFET DC, RF, and 1/f Noise Characteristics

Rong Yang、Yong Zhong Xiong、J. L. Shi、H. Qian、J. F. Li、J. Fu、W. Y. Loh、M. B. Yu、G. Q. Lo、N. Balasubramanian、D. -L. Kwong (1.Institute of Microelectronics、2.Institute of Microelectronics, Chinese Academy of Sciences)

https://doi.org/10.7567/SSDM.2007.P-3-23