The Japan Society of Applied Physics

[P-3-23] Impacts of Body Contact Structures on SOI NMOSFET DC, RF, and 1/f Noise Characteristics

Rong Yang, Yong Zhong Xiong, J. L. Shi, H. Qian, J. F. Li, J. Fu, W. Y. Loh, M. B. Yu, G. Q. Lo, N. Balasubramanian, D. -L. Kwong (1.Institute of Microelectronics, 2.Institute of Microelectronics, Chinese Academy of Sciences)

https://doi.org/10.7567/SSDM.2007.P-3-23