[P-4-2] An Improved Low Voltage Programming Scheme Using Forward Bias Assisted Drain Avalanche Induced Hot Electron Injection on P-Channel EEPROMs

Y. H. Huang, Steve S. Chung (1.Department of Electronic Engineering, National Chiao Tung University)

https://doi.org/10.7567/SSDM.2007.P-4-2