The Japan Society of Applied Physics

[P-4-8L] The impact of RTS on the Vt variation of 65nm MLC NOR flash memory

Yimao Cai、Wook-Hyun Kwon、Bong Yong Lee、Jung In Han、Chan-Kwang Park、Song Yun Heub (1.Advanced Technology Development Team2, Semiconductor R&D Center, Samsung Electronics Co., LTD.)

https://doi.org/10.7567/SSDM.2007.P-4-8L