[P-6-9] The Impact of Mixed-mode Electrical Stress on High-Frequency and RF Power Characteristics of SiGe HBTs

Sheng-Yi Huang, Cheng-Chou Hung, Wen-Shiang Liao, Chun-Yi Lin, Cheng-Wen Fan, Chih-Yuh Tzeng, Victor Liang, Kun-Ming Chen, Chun-Yen Chang (1.United Microelectronics Corporation (UMC), 2.National Nano Device Laboratories, 3.Department of Electronics Engineering, National Chiao Tung University)

https://doi.org/10.7567/SSDM.2007.P-6-9