[P-6-9] The Impact of Mixed-mode Electrical Stress on High-Frequency and RF Power Characteristics of SiGe HBTs

Sheng-Yi Huang、Cheng-Chou Hung、Wen-Shiang Liao、Chun-Yi Lin、Cheng-Wen Fan、Chih-Yuh Tzeng、Victor Liang、Kun-Ming Chen、Chun-Yen Chang (1.United Microelectronics Corporation (UMC)、2.National Nano Device Laboratories、3.Department of Electronics Engineering, National Chiao Tung University)

https://doi.org/10.7567/SSDM.2007.P-6-9