High Quality Crack-Free GaN-Based Epitaxy on Patterned Si(111) Substrate

Seung-Jae Lee; Gyu-Hyung Bak; Seong-Ran Jeon; Sang Hern Lee; Sangmook Kim; Seong-Hoon Jeong; Jong-Hyeob Baek

doi:https://doi.org/10.7567/SSDM.2007.P-8-7

2007 International Conference on Solid State Devices and Materials

2007年9月18日〜 2007年9月21日
Tsukuba International Congress Center (EPOCHAL TSUKUBA), Ibaraki, Japan

[P-8-7] High Quality Crack-Free GaN-Based Epitaxy on Patterned Si(111) Substrate

Seung-Jae Lee、Gyu-Hyung Bak、Seong-Ran Jeon、Sang Hern Lee、Sangmook Kim、Seong-Hoon Jeong、Jong-Hyeob Baek (1.Korea Photonics Technology Institute (KOPTI))

https://doi.org/10.7567/SSDM.2007.P-8-7

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