[A-4-3] The influence of the intensity of an electric field on properties of P(VDF-TeFE) thin films during the annealing process

J. H. Jeong¹, D. Terashima¹, C. Kimura¹, H. Aoki¹ (1.Osaka Univ. , Japan)

https://doi.org/10.7567/SSDM.2010.A-4-3