[B-1-2] Advantage of High-pressure Oxidation for Ge/GeO2 Stack Formation C. H. Lee1、T. Nishimura1,2、T. Tabata1、S. Wang1、K. Nagashio1,2、K. Kita1,2、A. Toriumi1,2 (1.Univ. of Tokyo、2.JST-CREST , Japan) https://doi.org/10.7567/SSDM.2010.B-1-2