[C-1-3] Drastic reduction of the low frequency noise in Si(100) p-MOSFETs

P. Gaubert¹, A. Teramoto¹, R. Kuroda¹, Y. Nakao¹, H. Tanaka¹, T. Ohmi¹ (1.Tohoku Univ. , Japan)

https://doi.org/10.7567/SSDM.2010.C-1-3