[C-8-3] Effect of Positive Gate Stressing on the Recoverable Component of Negative-Bias Temperature Instability

A. A. Boo¹、D. S. Ang¹、Z. Q. Teo¹、C. M. Ng² (1.Nanyang Tech. Univ.、2.GLOBALFOUNDRIES Singapore Pte. Ltd. , Singapore)

https://doi.org/10.7567/SSDM.2010.C-8-3