Real-time synchrotron radiation X-ray diffraction and abnormal temperature dependence of photoluminescence from erbium silicates on SiO<sub>2</sub>/Si substrates

H. Omi; T. Tawara; M. Tateishi; H. Komatsu; S. Takeda; Y. Tsusaka; Y. Kagoshima; J. Matsui

doi:https://doi.org/10.7567/SSDM.2010.D-9-1

[D-9-1] Real-time synchrotron radiation X-ray diffraction and abnormal temperature dependence of photoluminescence from erbium silicates on SiO₂/Si substrates

H. Omi¹, T. Tawara¹, M. Tateishi¹, H. Komatsu¹, S. Takeda², Y. Tsusaka³, Y. Kagoshima³, J. Matsui² (1.NTT Basic Res. Labs., 2.Univ. of Hyogo, 3.CAST , Japan)

https://doi.org/10.7567/SSDM.2010.D-9-1

2010 International Conference on Solid State Devices and Materials

[D-9-1] Real-time synchrotron radiation X-ray diffraction and abnormal temperature dependence of photoluminescence from erbium silicates on SiO2/Si substrates

[D-9-1] Real-time synchrotron radiation X-ray diffraction and abnormal temperature dependence of photoluminescence from erbium silicates on SiO₂/Si substrates