Real-time synchrotron radiation X-ray diffraction and abnormal temperature dependence of photoluminescence from erbium silicates on SiO<sub>2</sub>/Si substrates

[D-9-1] Real-time synchrotron radiation X-ray diffraction and abnormal temperature dependence of photoluminescence from erbium silicates on SiO₂/Si substrates

H. Omi¹、T. Tawara¹、M. Tateishi¹、H. Komatsu¹、S. Takeda²、Y. Tsusaka³、Y. Kagoshima³、J. Matsui² (1.NTT Basic Res. Labs.、2.Univ. of Hyogo、3.CAST , Japan)